Fig. 2: Thin film characterization. | Nature Communications

Fig. 2: Thin film characterization.

From: Crystal-facet-dependent surface transformation dictates the oxygen evolution reaction activity in lanthanum nickelate

Fig. 2: Thin film characterization.The alternative text for this image may have been generated using AI.

a RHEED intensity evolution during PLD growth of LaNiO3−δ on a (001)-oriented SrTiO3 substrate. Inset: RHEED pattern after growth. b X-ray diffractogram of representative 20 nm LaNiO3−δ films in (001), (110) and (111) orientation. Each diffractogram shows the most intense substrate and film peaks for the given orientation. c AFM scans of the same films. The root-mean-square roughness is below 350 pm for all films.

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