Fig. 2: Schematic of crystal axis projections used for grain texture analysis.
From: Quantification and prediction of solidification textures under additive manufacturing conditions
a An IPF (out-of-plane direction Z) map for Al3Si at 15 μs. Black lines delimit grains calculated assuming a 5∘ inner-grain misorientation threshold. The green grain on the right is selected to highlight the coordinate system and variables. The red dashed line delimits the pixels near the solid-liquid interface selected for analysis. The gray box shows the area magnified in the panels on the right-hand side. The methodology explained in the main text is used to define, for every grain time-step, (b) the secondary [100] direction or ds[100] (red), (c) the primary [010] direction or dp[010] (blue) on the plane perpendicular to ds[100], and (d) the primary [011] direction or dp[011] (orange) on the plane perpendicular to ds[100]. The grain coordinate system (X, Y, Z) is shown in gray in panels (b–d). Crystallographic data and their corresponding analysis codes are provided as Source Data files.
