Figure 6
From: Operando SXRD study of the structure and growth process of Cu2S ultra-thin films
(h, k, 1.05) reciprocal space map of the thin film. Units are expressed in the metrics of the pseudohexagonal silver lattice. The h’ values are related to the h values by the relation: h’ =h + k cos 60°. The blue segments are the unitary vectors of the hexagonal periodicity of the diffraction effects of the film.
