Figure 4

Elemental distribution on the surface of nanoassemblies probed by EDS-mapping. TEM and EDX spectra of chromium (Cr) sequestered hybrid material (a). Backscattered electron image shown in the top left panel of figure b, to verify elemental composition. Elemental spot maps of C, S, Fe and Cr, measured by STEM-EDX, are shown in the following panels of (b), confirming the Cr sequestration on to the hybrid nano assembly.