Nature Materials 3, 663–664 (2004).
In this News and Views piece, a problem in the printing process created faults within Fig. 2, which should have appeared as shown below.
Maurice et al. used an STM to image both the oxide surface and the buried interface3. At the first bias voltage (V1), the tunnelling current is generated by the conduction band of the oxide film, and the oxide surface can be observed. At V2 (<V1) the unoccupied electronic states of the metal are probed and the image produced corresponds to the metal surface underneath the oxide.
Additional information
The online version of the original article can be found at 10.1038/nmat1226
Rights and permissions
About this article
Cite this article
Ryan, M. Erratum: Peering below the surface. Nature Mater 3, 757 (2004). https://doi.org/10.1038/nmat1262
Issue date:
DOI: https://doi.org/10.1038/nmat1262
