Supplementary Figure 2: Offset and aligned SPIM beams as viewed in the bottom camera.
From: Dual-view plane illumination microscopy for rapid and spatially isotropic imaging
Top: offset beams from each arm, as viewed through bottom imaging path (with the 10x objective), on a glass coverslip coated with yellow-green fluorescent beads. Red arrows indicate beam waist, blue arrows indicate reflections of each beam from coverslip (laterally displaced from the beam waist). Bottom: beams are aligned after adjusting objective adjuster. Note that beams have not been scanned to create the light sheet. Scalebars: 200 μm.
