Supplementary Figure 5: Epifluorescence, SPIM, and overlapped beams as viewed in arm A camera.
From: Dual-view plane illumination microscopy for rapid and spatially isotropic imaging

Top: Epifluorescence signal detected in arm A, when illuminating with sheet generated by arm A. Middle: Fluorescence detected by arm A, when illuminating with sheet generated by arm B (laser input to arm A is blocked). Bottom: The two sheets are aligned when the epifluorescence and SPIM signals overlap. The sample is a coverslip coated with yellow-green fluorescent beads. Scalebars: 50 μm.