Fig. 1: Formation process of PtFe IMC.
From: In-situ atomic tracking of intermetallic compound formation during thermal annealing
a–e Time-series AC-HAADF-STEM images of a specific nanoparticle. Scale bar: 2 nm. f–h FFT pattern of the nanoparticle in c–e and corresponding schematic crystal structure (i–k), respectively. l Ex-situ XRD pattern after heating at different temperatures compared with PtFe (ICSD No.42589) and Pt3Fe (ICSD No.56275). m The normalized in-situ X-ray absorption near-edge spectra (XANES) at the Pt L3-edge of samples annealed at different temperatures. Note: the XX in PtFe-XX represents the annealing temperature. n The k3-weighted Fourier transform extended X-ray absorption fine structure spectra (EXAFS) in R-space. The dotted lines indicate the fitting results. o The change of Pt-Fe, Pt-Pt coordination number and corresponding ratio with the annealing temperature. Source data are provided as a Source Data file.
