Fig. 2: SOT characterization.

a Transverse second-harmonic resistance \({R}_{{{\rm{xy}}}}^{2{{\rm{\omega }}}}\) as a function of the angle \({{\rm{\alpha }}}\) and the fitting curves using Eq. (1) for samples with \({t}_{{{\rm{Pt}}}}\) = 1.5 nm, b \({R}_{{{\rm{xy}}}}^{2{{\rm{\omega }}}}\) as a function of the inverse effective field \(1/{B}_{{{\rm{k}}}}+{B}_{{{\rm{ext}}}}\), c \({B}_{{{\rm{DL}}}}\) as a function of current density, d \({\xi }_{{{\rm{DL}}}}\) as a function of Pt thickness. The inset in (a) shows \({R}_{{{\rm{xy}}}}^{2{{\rm{\omega }}}}\) as a function of the angle \({{\rm{\alpha }}}\) at different magnetic fields for an ac current of 6 mA. Error bars represent fitting uncertainty.