Fig. 7: Wnt3a patterns reduce the size of proliferative crypts in Apc-/- monolayers. | Nature Communications

Fig. 7: Wnt3a patterns reduce the size of proliferative crypts in Apc-/- monolayers.

From: Long-range organization of intestinal 2D-crypts using exogenous Wnt3a micropatterning

Fig. 7

a Immunofluorescence images of Apc-/- monolayers cultured with and without Rspo. Cells were stained for F-actin, cell nuclei (DNA), and Ki67. Scale bars: 50 µm. b Quantification of Ki67+ cells in Apc-/- monolayers. Mean ± SEM. Unpaired two tailed t-test with Welch’s correction. N = 3 experiments. c Crypt area distribution of Apc-/- crypt-like monolayers + Rspo. Black line corresponds to a Lorentzian fit. Mean ± SEM. N = 3 experiments. d Delaunay triangulation measuring the distance between crypt-like regions in Apc-/- monolayers + Rspo. Black line corresponds to a Gaussian fit. Mean ± SEM. N = 3 experiments. e Angular distribution of crypt-like regions in Apc-/- monolayers + Rspo. Black line corresponds to a Gaussian fit. Mean ± SEM. N = 3 experiments. f Immunofluorescence images of Apc-/- monolayers cultured with Rspo on freeze-dried rBM substrates micropatterned with Wnt3a (100 µm diameter dots spaced 200 µm apart in a square arrangement). Cells were stained for Wnt3a, F-actin, and cell nuclei (DNA) on the left panel, and for Wnt3a and Ki67 on the right panel. Dashed circles highlight Wnt3a patterns. Scale bars: 100 µm. g Characterization of crypt-like regions area in Apc-/- monolayers cultured with Rspo on Wnt3a micropatterns. Dashed black line corresponds to the Lorentzian fit of the Apc-/- crypts on non-patterned substrates. Mean ± SEM. N = 3 experiments. h Angular distribution of Delaunay triangles between crypt-like regions in Apc-/- monolayers cultured with Rspo on Wnt3a micropatterns. Dashed black line corresponds to the Gausian fit of the monolayers on non-patterned substrates. Mean ± SEM. N = 3 experiments. i Distribution of the distances between crypt-like regions in Apc-/- monolayers cultured with Rspo on Wnt3a micropatterns. Dashed black line corresponds to the Gausian fit of the monolayers on non-patterned substrates. Mean ± SEM. N = 3 experiments. Source data are provided as Source Data file.

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