Fig. 5: Stability investigation of NFA-based devices.

a Intrinsic stability of unencapsulated devices aged at 65 °C in a N2-filled glovebox. b MPP tracking of encapsulated PSCs measured at approximately 45 °C under LED illumination. Electric field distribution in (c) Y6- and d Y-CE-based PSCs under illumination and open-circuit conditions, acquired through cross-sectional KPFM. Scale bars: 200 nm.