Fig. 1: In-situ stability of HEM affected by localized temperature and thermal conductivity.

a Schematic diagram of the setup for the temperature measurement of HEMWE, where the thermocouples are inserted along the GDL layer near the cathode side (Ta), cathode catalyst layer near the HEM (Tb), and GDL layer near the anode side (Tc), respectively. b Temperature (Ta, Tb, Tc) evolution of HEMs operated in a water electrolyzer assembled with commercial HEM of FAAM−40 at various current densities. c Voltage evolution of the water electrolyzer assembled with FAAM−40 operated at different cell temperatures and the corresponding voltage degradation rates. d Schematic diagram of components in HEMWE for the numerical simulation and simulated 2D temperature contour plot of HEMs with k = 0.4 and k = 6.2 W m−1 K−1. e Simulated 1D temperature profile within the HEMWE assembled with HEMs with different thermal conductivities at a current density of 2 A cm−2. Unit of k is W m−1 K−1. HEM is indicated by a red shadow. f Simulated temperature contours of HEMs operated in HEMWE at various current densities assembled with HEMs with different thermal conductivities. The bipolar plate, gas diffusion layer, cathode catalyst layer, and anode catalyst layer are respectively abbreviated as BP, GDL, C-CL, and A-CL in panels (a, d, and e).