Fig. 4: Structural characterization of an 8L WSe2-(MoS2-WSe2)3-MoS2 superlattice. | Nature Communications

Fig. 4: Structural characterization of an 8L WSe2-(MoS2-WSe2)3-MoS2 superlattice.

From: Designable excitonic effects in van der Waals artificial crystals with exponentially growing thickness

Fig. 4

a High-angle annular dark-field scanning transmission electron microscopy (HAADF-STEM) image of a WSe2-(MoS2-WSe2)3-MoS2 superlattice with the corresponding atomic model overlaid. b The corresponding energy dispersive spectrometer (EDS) mapping images of W and Mo. c EDS intensity profiles for W (red) and Mo (blue) from (b). The dashed lines represent the positions of distinct atomic layers (W, red, and Mo, blue). The averaged interlayer distance Davg = 0.70 nm is calculated from the EDS data in (c). Scale bars in a, b are 2 nm.

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