Fig. 2: Electrical conductivities and tensile mechanical properties of the as-aged EMI-10 and EML-200 samples.
From: Overcoming the trade-off between conductivity and strength in copper alloys through undercooling
a, b The variations in electrical conductivity and Vickers microhardness with the aging time under 450 °C. The error bars represent the standard deviations of the measured microhardnesses. Notably, the standard deviations of the measured electrical conductivities are less than 0.5% IACS. c The engineering stress-strain curves under the peak aging condition (420 min, 450 °C). d The comprehensive property comparison between this work (red color) and the reported high conductivity Cu-Be alloys, Cu-Ni-Si alloys, Cu-Ti alloys and Cu-Cr-Zr alloys. Source data are provided as a Source Data file.
