Fig. 2: Scanning transmission electron microscopy (STEM) characterization for the CR750 alloy.
From: Enhancing the strength and ductility of a medium entropy alloy through non-basal slip activation
a, c STEM-BF images viewed from different directions. b Corresponding selected area electron diffraction (SAED) pattern from the cyan circle in (a). d, e Corresponding SAED patterns from the blue circle in (c). Red and cyan circles represent diffraction signals from the fcc matrix and the D019 phase, respectively. f Atomic-scale STEM high angle annular dark-field (STEM-HAADF) image of the fcc/D019 dual-phase region, showing D019 lamellae decorated with a high density of stacking faults. g Corresponding STEM energy-dispersive X-ray spectroscopy (STEM-EDS) mapping from the green square in (c), showing elemental partitioning in the two phases.
