Fig. 5: Transmission electron microscope (TEM) characterizations of KNLNST-0.3CuO. | Nature Communications

Fig. 5: Transmission electron microscope (TEM) characterizations of KNLNST-0.3CuO.

From: Oxygen vacancy-induced strengthening and toughening in (K,Na)NbO3-based piezoceramics revealed via nanoindentation

Fig. 5

a Integrated Differential Phase Contrast Scanning Transmission Electron Microscopy (iDPC-STEM) image of KNLNST-0.3CuO with inset showing O column and Nb column intensities of the marked region. b The overall intensity variations of the O column in KNLNST-0.3CuO. c Bright-field TEM image and d–j atomic elemental mapping of KNLNST-0.3CuO. The white rectangles provide direct comparison of the occupied position of different atoms in the same area.

Back to article page