Fig. 2: Investigation of electrical properties of NiOx films and interfacial chemical reaction. | Nature Communications

Fig. 2: Investigation of electrical properties of NiOx films and interfacial chemical reaction.

From: Stabilizing buried interface by bilateral bond strength equilibrium strategy toward efficient perovskite photovoltaics

Fig. 2

a–d XPS spectra of Ni 2p core levels for the control, CSA, TSA, and BTSA-modulated NiOx films. e Bar chart of the relative XPS peak area values of Ni4+, Ni3+, and Ni2+ extracted from the XPS spectra of Ni 2p core levels for the control, CSA, TSA, and BTSA-modulated NiOx films. The hole mobility (f) and the conductivity (g) of the control, CSA, TSA, and BTSA-modulated NiOx films. h Photographs of NiOx films before and after treatment with spin-coating FAI in DMF solution (Film 1), BTSA/FAI in DMF solution (Film 2), and bare DMF solution (Film 3). i UV-visible absorption spectra of the films of fresh and aged (UV illumination for 24 h) ITO/NiOx/FAI and ITO/NiOx/BTSA/FAI.

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