Fig. 2: Nanoscale structural characterisation.
From: Langmuir-Schaefer deposition of 2D PbS quantum dot superlattices with millimetre square coverage
STEM-HAADF micrographs of the low compression (a) and high compression (b) samples, respectively. The insets show the respective FFTs of the micrograph (scale bars: 200 nm, 0.5 nm−1). c GIWAXS and inset GISAXS pattern of the LC superlattice. The bottom and left axes belong to the GISAXS pattern, while the top and right axes belong to the GIWAXS one. The intensity scale is logarithmic for GISAXS and linear for GIWAXS. Due to the high dynamic range of the detector, two different scales are needed to properly visualise features at both low and high angles. d Corresponding GISAXS and GIWAXS patterns for the HC SL. The intensity scales are the same as in (c).
