Fig. 5: Cs-corrected STEM-ADF images of planar defects and defect healing upon heating. | Nature Communications

Fig. 5: Cs-corrected STEM-ADF images of planar defects and defect healing upon heating.

From: Observation of a guest-free Si46 clathrate-I framework from Ba8-xSi46 upon in situ vacuum heating

Fig. 5

Images observed along (a) the [001] direction and (b) the [110] direction. c Arrangement of different cages around the planar defect region viewed along different directions, and (d) comparison of different cages in different colours in this region. e ADF images showing defect region along the [110] direction taken at 400 °C. f Image of the same region but with the defect healed upon continuous heating. Scale bar: 2 nm.

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