Table 1 Brillouin zone sampling

From: High-throughput screening of 2D materials identifies p-type monolayer WS2 as potential ultra-high mobility semiconductor

Compound

{kc}

{qc}

Carrier type

{kf} = {qf}

h-Sb

242

122

electron

4802

   

hole

15602

SiH

242

122

electron

2402

   

hole

8402

Tl2O

242

122

electron

6002

   

hole

3602

Bi2TeSe2

182

92

electron

12602

   

hole

4502

GeSe

24 × 20

12 × 10

electron

600 × 500

   

hole

600 × 500

SnTe

202

102

electron

5002

   

hole

7002

ZrSe2

242

122

electron

4802

   

hole

7202

HfSe2

242

122

electron

3602

   

hole

7202

TiNCl

24 × 20

12 × 10

electron

360 × 300

   

hole

480 × 400

TiNBr

24 × 20

12 × 10

electron

480 × 400

   

hole

480 × 400

WS2

242

122

electron

7202

   

hole

13202

WTe2

242

122

electron

6002

   

hole

7202

MoS2

242

122

electron

7202

   

hole

4802

h-Bi

122

122

electron

12002

   

hole

9602

GeS

24 × 20

12 × 10

electron

720 × 600

   

hole

600 × 500

WSe2

122

242

electron

7202

   

hole

8402

  1. Brillouin zone grids employed for aiBTE calculations of carrier mobility of compounds in Set D, plus the four additional compounds MoS2, h-Bi, GeS, and WSe2. Unless otherwise specified, calculations are performed at room temperature (300 K), for a carrier concentration of 1010 cm−2. {kc} and {qc} refer to the coarse Brillouin zone grids for electron and phonon wavevectors in DFT and DFPT calculations, respectively. {kf} and {qf} indicate to the electron and phonon fine grids employed with Wannier–Fourier interpolation in EPW, respectively. Fine grids are determined by converging mobility values to an accuracy of less than 1 cm2/Vs.