Fig. 10: Denoiser preprocessing for multislice ptychography. | npj Computational Materials

Fig. 10: Denoiser preprocessing for multislice ptychography.

From: Unsupervised deep denoising for four-dimensional scanning transmission electron microscopy

Fig. 10

a Reconstruction errors from multislice ptychography of simulated 4D STEM datasets of SrTiO3 for different dose levels, corresponding to ranges of probe spacing values, defocus values and number of electrons in patterns. We only show those with lower errors and electron counts, and for simplicity do not convey the defocus values. b The reconstructed potential from noise-free data, for comparison against that from (c) noisy and (d) denoised data for the parameter combination indicated by the arrow in (a). Calculations assume 16 e−. Å−2, 1 Å probe spacing, and 50 Å defocus (which as per Fig. 3 does allow successful denoising of SrTiO3 at 1 Å).

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