Fig. 5: Reconstruction error of individual CBED patterns with varying convergence semiangle.
From: Unsupervised deep denoising for four-dimensional scanning transmission electron microscopy
For each convergence semiangle, sample patterns of synthetic noise-free datasets, their denoised version and the absolute difference between these two is shown in the first, second and third rows respectively. Since the reconstruction error was already quantified in Fig. 3b, in order to visualise the structure in the patterns here we scale each row to have maximum value equal to one. This includes the last row, which thus shows the reconstruction error to be noticeably less for lower convergence semiangles.
