Fig. 8: Denoiser preprocessing for centre-of-mass and symmetry STEM imaging.
From: Unsupervised deep denoising for four-dimensional scanning transmission electron microscopy
Comparison of noisy, denoised and noise-free 4D STEM simulations for 28 Å thick CeB6, at 16 electrons in each CBED pattern, used to generate (a) centre-of-mass (CoM) STEM images (with colour denoting CoM direction and brightness denoting CoM magnitude) and (b) Symmetry STEM images for 90∘ rotational symmetry. Plots of the (c) intensities reconstruction error EI = ∣∣I* − ID∣∣F, (d) CoM error ECoM = ∣∣CoM(I*) − CoM(ID)∣∣F where CoM(I) is comprised of two images for any dataset I (one for the first moment in each of the x and y directions), and (e) symmetries error ESymm = ∣∣Symm(I*) − Symm(ID)∣∣F where Symm(I) is comprised of 360 images for any dataset I (i.e. all rotational symmetries at 1∘ increments), all compared to true data. f–j As per (a–e) but at 240 Å thickness.
