Fig. 4: Fingerprint recognition application and mechanical reliability of the dual-mode device. | npj Flexible Electronics

Fig. 4: Fingerprint recognition application and mechanical reliability of the dual-mode device.

From: Photoresponsive dual-mode memory transistor for optoelectronic computing: charge storage and synaptic signal processing

Fig. 4

a Schematic representation of fingerprint recognition-based ID classification using the proposed device. b Accuracy according to epoch for fingerprint recognition simulation. c Schematic representation of the comprehensive bending test for 500 cycles. d The change in memory window and e memory ratio over bending cycle. f The change in ID according to time after applying 100, 300, and 500 bending cycles. g The change in potentiation–depression curves as a function of bending cycle.

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