Extended Data Fig. 4: A schematic of our computational grid on the O-xz plane.
From: Experimental constraints on the symmetron field with a magnetically levitated force sensor
The central part of the diagram shows the primary structures. Three distinct red boxes highlight enlarged specific areas. The top-left subplot shows the arrangement of the source mass, electrical shield, and test mass along the z-axis. The bottom-left one shows the most refined grids surrounding the electrical shield. Meanwhile, the top-right sub-figure illustrates the mesh structure on the source mass, as seen from the O-xy plane. A colorbar below indicates the varying densities of the different materials employed in our experimental setup. Overall, high-level refinement is employed to capture the detailed nuances of our experimental apparatus. High-level refinement is also employed to areas proximate to material boundaries for enhanced numerical accuracy.
