Fig. 2: Radical OLED device structure and optoelectronic characterization. | Nature Photonics

Fig. 2: Radical OLED device structure and optoelectronic characterization.

From: Efficient near-infrared organic light-emitting diodes with emission from spin doublet excitons

Fig. 2

a, Device structure with energy levels for hole injection layer (HIL), hole transport layer (HTL), emitting layer (EML) and electron transport layer (ETL). TAPC, 1,1-bis[(di-4-tolylamino)phenyl]cyclohexane; TCTA, 4,4′,4″-tris(carbazol-9-yl)triphenyl-amine. b,c, EQE–current density (b) and radiance–current density (c) plots for the devices. d, EL spectra at 1 mA cm−2. e, JV characteristics for the devices with and without TTM-TPA doping. f, Comparison of NIR OLEDs with peak wavelengths between ~780 nm and ~900 nm regarding maximum EQE and radiance (Supplementary Table 2).

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