Fig. 3: Suppression of linear anisotropy effects.

a,e, Sketch of the measurement principle: a linear polarizer rotates the plane of polarization when measuring the samples of vertically and horizontally linear nanorods (a) or left- and right-handed chiral structures (e). b,f, CD (top) and ORD (bottom) signals of the linear nanorods (b) and chiral samples (f) when rotating the plane of polarization. Each point represents the average signal on the array of nanostructures in the corresponding image. c,g, Averaging the CD (top) or ORD (bottom) signal for each sample independently over a certain rotation angle range until two full rotations are averaged. Each point represents the average signal on the array of nanostructures in the image averaged over the given angle range. d,h, CD (top) and ORD (bottom) images after averaging two full rotations (all the angles shown in b and f) of the linear structures (d) and chiral structures (h). LH, left handed; RH, right handed. The measurements were performed at a wavelength of 690 nm. Scale bar, 50 μm.