Extended Data Fig. 1: STM/S measurement of a fabricated θt ≈ 31.5° twisted bilayer WSe2 SM.
From: Robust supermoiré pattern in large-angle single-twist bilayers
a, An STM image of the 31.5° twisted bilayer WSe2, showing a <1011 cm−2 low density of defects thanks to the high-quality bulk crystal WSe2 (VBias = −0.98 V, I = 100 pA). b, An in-gap taken STM topography image of θt ≈ 31.5° tWSe2 (VBias = −0.6 V, I = 100 pA), revealing unambiguous SM patterns. c, The FFT image of b. The black squares, blue circles, and red diamonds represent top layer WSe2 Bragg peaks, second order and first order tWSe2 moiré, with SM splitting, respectively. d, Filtered iFFT image using the FFT peaks in red diamonds. e, The logarithmic scale constant height STS taken in the pristine region (Vset = −2.0 V, I = 100 pA, Vamp = 29 mV). Blue and green arrows represent the \({\Gamma }_{1}\) and KVBM respectively. f, The constant current STS taken at the same site (Vint = −1.4 V, I = 50 pA, Vamp = 19 mV). Blue and green arrows represent the \({\Gamma }_{1}\) and KVBM respectively. Scale bars: 3 nm.
