Extended Data Fig. 8: Raw data of high resolution measurements.
a, The raw energy scan around the elastic line of the second sample at \({\boldsymbol{Q}}=\left(\mathrm{0,0,1}\right)\) using the same setup as the first sample, Ef = 3.23 meV. b, The raw data of the polarized \({\sigma }_{x}^{{NSF}}({\boldsymbol{Q}},E)\) and \({\sigma }_{x,y}^{{SF}}({\boldsymbol{Q}},E)\) at E = 0 ± 0.02 meV using Ef = 3.23 meV along the [0, 0, l] direction. The vertical error bars represent statistical errors of 1 standard deviation.
