Extended Data Fig. 2: Vertical phase separation analysis of the polymer/elastomer blending system.
a, ToF-SIMS depth profiles of the characteristic F− ion for polymer N1 in composite films. Inset, the corresponding 3D illustration of F− ions in the composite film as a function of film depth. b, Ratio changes between S(2p) and C(1 s) peak (S/C ratio) obtained from the XPS profile element analysis of the N2/elastomer composites. Inset, the corresponding 3D illustration of the vertical phase separation. c, ToF-SIMS depth profiles of the characteristic CN− ion for polymer N2 in composite films. Inset, the corresponding 3D illustration of CN− ions in the composite film as a function of film depth.
