Extended Data Fig. 2: Diamond sample characterization.
From: Signal amplification in a solid-state sensor through asymmetric many-body echo
a, Secondary ion mass spectrometry (SIMS) measurements on the diamond sample, showing a 9 nm thick (FWHM) δ-doped 15N layer within an isotopically purified 12C epilayer. b, XY8 decay measured under the native quantization axis (ηnative). The decay timescale T2,XY8 is used to characterize the density of NV− (19 ppm ⋅ nm per lattice orientation group). c, Ramsey decay measured under the native quantization axis (ηnative). The decay timescale \({T}_{2}^{* }\) is used to characterize the density of P1 centers (upper bounded by 230 ppm ⋅ nm). Errors represent 1 s.d. accounting statistical uncertainties.
