Extended Data Fig. 5: Simulation of Dark sectioning under different levels of defocus background.
From: Dark-based optical sectioning assists background removal in fluorescence microscopy
(a) Simulated OTF of different layers in the z-axis. (b) Simulated profiles of OTF in different layers in the z-axis, with the different weights of OTF. (c) The lower weight means less in-focus information and more out-of-focus information, where w is the weight factor to control the ratio between in-focus and out-of-focus information. Simulated comparisons between GT, WF with 3DOTF, WF with 2DOTF, and Dark sectioning processed WF images using w = 0, 0.8, 0.9, and 0.98 of (d) circular and (e) linear structures. Lateral scale bar: 4 μm. Axial scale: 41 layers, 125 nm per layer.
