Fig. 1: Structural characterization.
From: Significant electron-magnon scattering in layered ferromagnet Cr2Te3
a Cross-sectional high-angle annular dark-field scanning transmission electron microscopy (HAADF-STEM) image and b Energy dispersive X-ray spectroscopy (EDS) maps of a 20 nm-thick Cr2Te3 film. c High magnification image of the Cr2Te3 film shown in (a). d Nanobeam electron diffraction pattern of the image shown in (c). Indices of Cr2Te3 are labeled. e Depth profile of the elements using EDS mapping.
