Fig. 2: Remote deformation of a two-dimensional silica sample. | Communications Physics

Fig. 2: Remote deformation of a two-dimensional silica sample.

From: Predicting fracture in disordered network materials using the local intelligent stress threshold indicator

Fig. 2

The upper panel shows the configuration snapshot after the selected atomic-scale rearrangements. The middle panel represents the corresponding nonaffine displacement field after the first rearrangement (a), the third rearrangement (b), and the sixth rearrangement (c). The lowest panel represents the stress(τ)-strain(γ) relations with the corresponding stress drop occurring during the selected rearrangements, colored in red. In the middle panels, the non-affine displacement fields are  plotted together with the local shear stress threshold maps in the background. A high correlation is observed between the actual and predicted zones of local rearrangements in the upper and middle panels. The red color in the prediction maps indicates low threshold stress values, i.e., zones that are expected to be susceptible to rearrangements. The blue color indicates high threshold stress values, i.e., zones that are not expected to be susceptible to rearrangements.

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