Fig. 1: SEM and EDS analysis of a SnGe sample annealed at 350 °C.

a Top-view SEM image of the SnGe sample. b SEM image of the SnGe sample tilted at 52^∘. c Histogram and two-peak bimodal Gaussian fit of the diameters of the dots shown in a. d EDS line scan showing at.% of Sn (red) and Ge (green).