Fig. 5: Scanning SQUID susceptometry on 42 nm thick RuO2(100) film indicates local Tc microscopically varying within 100 mK. | Communications Materials

Fig. 5: Scanning SQUID susceptometry on 42 nm thick RuO2(100) film indicates local Tc microscopically varying within 100 mK.

From: Strain-induced superconductivity in RuO2(100) thin-films

Fig. 5

a–d Temperature-dependent susceptibility χ(T) images on RuO2. The temperature labels represent the average temperatures during the scanning process. e χ(T) at P1, P2, and P3 denoted in a. f Local Tc is defined as fitted χ(Tc) = − 0.2Φ0/A (dashed line in e). g Local Tc at the cross-section taken along the dashed line in f.

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