Fig. 1: Electrical measurements on individual flakes with C-AFM and patterned contacts. | Communications Materials

Fig. 1: Electrical measurements on individual flakes with C-AFM and patterned contacts.

From: Anisotropic charge transport in 2D single crystals of Ti3C2Tx MXenes

Fig. 1

a Illustration of C-AFM measurement on an individual flake deposited on a metallic electrode, on a Si/SiO2 substrate. b Illustration of a conventional four-contact measurement on an individual flake. c 3D view of the AFM topography of a Ti3C2Tx flake deposited partially on an electrode, obtained in tapping mode. d 3D view of the AFM topography of patterned contacts on a Ti3C2Tx flake, obtained in tapping mode.

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