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Showing 1–4 of 4 results
Advanced filters: Author: Rui-Tao Wen Clear advanced filters
  • Ion trapping has been found to be responsible for the performance degradation in electrochromic oxide thin films. This paper visualizes ion trapping and detrapping dynamics, and provides a general picture of electrochromism in amorphous WO3.

    • Renfu Zhang
    • Qinqi Zhou
    • Rui-Tao Wen
    ResearchOpen Access
    Nature Communications
    Volume: 15, P: 1-12
  • Substrate patterning offers additional degrees of freedom to engineer the structure and function of a semiconductor device. Here, fully-enclosed germanium cavities, with size and position tunable through the initial mask pattern, can be created through an unexpected self-assembly process.

    • Yiwen Zhang
    • Baoming Wang
    • Rui-Tao Wen
    ResearchOpen Access
    Nature Communications
    Volume: 15, P: 1-9