Abstract
WE have prepared thin films of beryllium in which it is possible to observe directly the arrangements of dislocations and other structural defects by transmission electron microscopy. The films were made by two methods.
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References
Hirsch, P. B., Horne, R. W., and Whelan, M. J., Phil. Mag., 1, 677 (1956).
Bradley, D. E., and Phillips, R., Proc. Phys. Soc., B, 70, 533 (1957).
Phillips, R. (to be published).
Tuer, G. L., and Kaufmann, A. R., Chapter 7 in “The Metal Beryllium”, by White, D. W., and Burke, J. E. (A.S.M., 1953).
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BAIRD, J., HARTREE, O. & PHILLIPS, R. Transmission Electron Microscopy of Beryllium. Nature 182, 1660 (1958). https://doi.org/10.1038/1821660a0
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DOI: https://doi.org/10.1038/1821660a0
