Abstract
Grazing incidence X-ray diffraction (GIXD) was performed on three polyurethane films, prepared with polyol OH number of 120, 375, and 600 cast on various substrates, such as silicon, gold, glass, sodium chloride, and zinc phosphated steel. Surface topography did not affect the structural variation of polyurethane films along with the film depth controlled by an angle of incidence. Change of the crystallinity was occurred by a simultaneous change of interplanar spacing, indicating that substrate-induced crystallization took place. The depth that the substrate surface influenced the crystallization of the polyurethane films corresponded to the halfway of the variation of interplanar spacing. The substrate-induced ordering of the polyurethane films varied according to the substrate surface conditions, presumably depending on the attraction force forward the heterogeneities inside the polymer bulk film. It was suggested that the substrate-induced crystallization of the polyurethane on the various substrates depends on the mobility of heterogeneities toward the polar substrate surface rather than other possible mechanisms such as temperature gradient, chemical similarity, lattice match, and thermal shear stress.
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Kim, J., Cho, J., Ryba, E. et al. Interfacial Structures of Polyurethane Thin Films on Various Substrate Materials. Polym J 35, 929–937 (2003). https://doi.org/10.1295/polymj.35.929
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DOI: https://doi.org/10.1295/polymj.35.929
