Table 5 The SSIM between defect 3 and its sound area, before and after applying the proposed processing method
Position | Raw image of sample A | Processed image of sample A | Raw image of sample B | Processed image of sample B |
|---|---|---|---|---|
Defect 3 | 0.65 | 0.64 | 0.66 | 0.35 |
Position | Raw image of sample A | Processed image of sample A | Raw image of sample B | Processed image of sample B |
|---|---|---|---|---|
Defect 3 | 0.65 | 0.64 | 0.66 | 0.35 |