Fig. 7: Registration errors.
From: Subnanometer localization accuracy in widefield optical microscopy
a–c Plots showing registration errors in (a) the x direction, (b) the y direction, and (c) total magnitude, due mostly to different mean values of image pixel size and a lateral offset for localization data of different colors. d–f Plots showing registration errors in (d) the x direction, (e) the y direction, and (f) total magnitude, after applying a similarity transformation to the localization data, due mostly to variable distortion from chromatic aberration. g–i Plots showing registration errors in (g) the x direction, (h) the y direction, and (i) total magnitude, after applying correction models to the localization data before a similarity transformation, due mostly to localization error and empirical localization precision
