Fig. 4: Purcell effect for TADF emitters with different horizontal orientations in weak microcavities.

Transient PL decay characteristics of a the CzDBA in the devices TE-Cz and BE-Cz and b the DMAC-BP in the devices TE-DM and BE-DM. Theoretically calculated IQE, EQE, and EQE loss due to nonradiative decay, TTA and STA, c for device BE-DM and d for device TE-DM. Areas filled with stripes in c and d correspond to the EQE loss caused by the Îł.