Table 1 Comparison of LSEC sieve plate contrast between various label-free methods

From: Label-free superior contrast with c-band ultra-violet extinction microscopy

 

Contrast on sieve plate [σ/M]

Improvement with qUV

Contrast on sieve plate [Michelson]

Improvement with qUV

Brightfield (BF)

0.048

12x

0.257

4x

DIC

0.084

7x

0.368

3x

Holotomography (HT)

0.002

293x

0.006

154x

Type-C UV (UV)

0.085

7x

0.330

3x

qDPC UV (qUV)

0.586

–

0.998

–

  1. The metric for contrast was either the standard deviation σ of pixel values in the sieve plate region, normalized by the median value M or the approach by Michelson (peak-to-peak)23
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