Fig. 4: Surface height profile of resin section in FWM imaging.
From: Correlative light-electron microscopy using small gold nanoparticles as single probes
Colour-coded height profile (blue: 0, red: 8.51 µm) obtained from the phase of the reflected probe field, shown in the inset on a grey scale from −π (black) to π (white), for the region in Fig. 1c and Fig. S7. The FWM field amplitude of AuNPs is overlaid on the left panel and AuNPs are labelled. The surface profile shows height differences of several microns, indicating a ripple in the pioloform layer and the supported 300 nm thin resin section. AuNPs labelled in red are those excluded from the CLEM correlation analysis as they are too out of focus (AuNP 10 is 1.9 µm below and AuNP 13 is 0.8 µm above AuNP 5). Scale bar: 10 µm
