Table 1 Dark current drift for part of the reported perovskite-based X-ray or γ-ray detectors

From: Detector-grade perovskite single-crystal wafers via stress-free gel-confined solution growth targeting high-resolution ionizing radiation detection

Materials

Time (h)

Sensitivity (µC \({{\mathrm{Gy}}^{-1}_{\mathrm{air}}}\) cm−2)

Dark current drift (nA cm−1 s−1 V−1)

References

3D MAPbI3 single crystal

~1

2.6 × 106

1.2 × 10−5

23

3D BiOBr-Cs2AgBiBr6 polycrystalline wafer

~0.1

250

7.4 × 10−5

35

3D MAPbBr3 single crystal/Si integration

2.1 × 104

1.2 × 10−3

9

3D MAPbI3 single crystal

~17.5

2.0 × 10−3

30

2D (PEA)2PbI4 single crystal

~23

1.9 × 10−7

0D MA3Bi2I9 single crystal

~24

1947

5.0 × 10−10

2D (PEA)2PbI4 single crystal

~25

848

3.25 × 10−7

31

2D (o-F-PEA)2PbI4 single crystal

~25

1724.5

8.48 × 10−8

2D Rb3Bi2I9 single crystal

~0.5

159.7

1.82 × 10−7

32

2D (BDA)PbI4 single crystal

~14

242

6.06 × 10−9

33

2D (F-PEA)2PbI4 single crystal

~2

3402

4.9 × 10−8

34

3D MAPbI3 single crystal

~15

3.0 × 105

4.0 × 10−8

This work