Fig. 2: Calibration of the Compton scattering signal.
a Measured signals in the upper (blue) and lower (green) off-axis detectors from a silicon wedge sample, made with 2000 ms exposures at each point and an incident flux of 1.54 × 106 ph/ms. b Background-subtracted detector per-pixel cross section of Si, shown on a greyscale ranging from 0 (black) to 8 × 10−8 cm2/g (white). Contours of the scattering angle θ are indicated. c A line-out of the response along the dashed orange line of (b), and the corresponding computed cross section (dashed line)
