Fig. 5: Polarization-dependent characterization of the Si/CCPS hybrid device. | Light: Science & Applications

Fig. 5: Polarization-dependent characterization of the Si/CCPS hybrid device.

From: Non-reciprocal response in silicon photonic resonators integrated with 2D CuCrP2S6 at short-wave infrared

Fig. 5

a Schematic representation of the integrated CCPS/Si device with a magnetic field applied perpendicular to the direction of light propagation. b Normalized transmission spectra for the TE mode at magnetic fields of 0 and 40 mT, illustrating resonance detuning. c Normalized transmission spectra for TM mode at 0 and 40 mT, demonstrating insensitivity to the magnetic field as evidenced by the unshifted peak positions, the y-axis values have been scaled up by a factor of two to improve data visibility. Insets in (b) and (c) show the electric field profile in the hybrid CCPS/Si device, aligned with the direction of the magnetic field

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