Fig. 4: Intensity, phase and polarization properties of tightly focused light.
From: Light structuring via nonlinear total angular momentum addition with flat optics
a Schematic of the focusing system and the reference frame. b Numerically calculated intensity, \({\left|{{\bf{E}}}^{{\rm{f}}}\cdot {{\bf{e}}}_{i}^{{\boldsymbol{* }}}\right|}^{2}\), and phase, \(\arg \,({{\bf{E}}}^{{\rm{f}}}\cdot {{\bf{e}}}_{i}^{\ast })\), distributions of electric fields in the focal plane (z0 = 0) of the lens (NA = 0.85) for input wave Ein ellipticity angles α = 45°, 43.9° and 37.9°, from top to bottom. An input RCP plane wave (located at the pole of the Poincaré sphere, α = 45°) undergoes transformation under focusing, resulting in a beam that includes all three polarization components: \({{\bf{e}}}_{R}\), \({{\bf{e}}}_{L}\) and \({{\bf{e}}}_{z}\). Patterns are normalized to the maximum intensity of the corresponding \({\left|{{\bf{E}}}^{{\rm{f}}}\cdot {{\bf{e}}}_{R}^{* }\right|}^{2}\) distribution. Scale bar, 2 μm
