Fig. 4: Parameter sensitivity analysis. | Light: Science & Applications

Fig. 4: Parameter sensitivity analysis.

From: OAM multiplication operator enabled holographic multiplexing

Fig. 4

a Structural similarity index (SSIM) degradation under fractional topological charge TC offset. Operator-enabled holography exhibits faster SSIM decline (red curve) compared to conventional OAM holography (black curve) cross all offset ranges. Even minor deviations in the b transformation scaling factor n and c propagation distance d result in dramatic SSIM drops. Narrow bandwidth highlights the stringent requirement for the parameter accuracy

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